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Relative SHG measurements of metal thin films: Gold, silver, aluminum, cobalt, chromium, germanium, nickel, antimony, titanium, titanium nitride, tungsten, zinc, silicon and indium tin oxide

机译：金属薄膜的相对sHG测量：金，银，铝，钴，铬，锗，镍，锑，钛，氮化钛，钨，锌，硅和氧化铟锡

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1. Relative SHG measurements of metal thin films: Gold, silver, aluminum, cobalt, chromium, germanium, nickel, antimony, titanium, titanium nitride, tungsten, zinc, silicon and indium tin oxide [J] . Franklin Che, Serge Grabtchak, William M. Whelan, Results in Physics . 2017,第1期

机译：金属薄膜的相对SHG测量：金，银，铝，钴，铬，锗，镍，锑，钛，氮化钛，钨，锌，硅和铟锡氧化物
2. Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride [J] . Jan Kischkat, Sven Peters, Bernd Gruska, Applied optics . 2012,第28期

机译：氧化铝，二氧化钛，二氧化硅，氮化铝和氮化硅薄膜的中红外光学性质
3. Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride [J] . Jan Kischkat, Sven Peters, Bernd Gruska, Applied optics . 2012,第28期

机译：氧化铝，二氧化钛，二氧化硅，氮化铝和氮化硅薄膜的中红外光学性质
4. Effect of chromium-gold and titanium-titanium nitride-platinum-gold metallization on wire/ribbon bondability [C] . Jianbiao Pan, Pafchek, R.M., Electronics Manufacturing Technology Symposium, 2004 . 2004

机译：铬-金和钛-氮化钛-铂-金金属化对导线/碳带键合能力的影响
5. Preparation and nitrobenzene reaction kinetics of microcrystalline tungsten bronze thin films with or without transition metal (silver, titanium, chromium, manganese, iron, cobalt, nickel and copper) coatings. [D] . Khan, Kashif Rashid. 2006

机译：具有或不具有过渡金属（银，钛，铬，锰，铁，钴，镍和铜）涂层的微晶钨青铜薄膜的制备及其硝基苯反应动力学。
6. Oxygen Partial Pressure Impact on Characteristics of Indium Titanium Zinc Oxide Thin Film Transistor Fabricated via RF Sputtering [O] . Ming-Hung Hsu, Sheng-Po Chang, Shoou-Jinn Chang, 2017

机译：氧分压对射频溅射制备铟钛锌氧化物薄膜晶体管特性的影响
7. Relative SHG measurements of metal thin films: Gold, silver, aluminum, cobalt, chromium, germanium, nickel, antimony, titanium, titanium nitride, tungsten, zinc, silicon and indium tin oxide [O] . Franklin Che, Serge Grabtchak, William M. Whelan, 2017

机译：金属薄膜的相对sHG测量：金，银，铝，钴，铬，锗，镍，锑，钛，氮化钛，钨，锌，硅和氧化铟锡
8. Low Temperature Film Growth of the Oxides of Zinc, Aluminum, and Vanadium (and Related Systems, Oxides of Gold and Germanium, Nitrides of Aluminum and Tungsten) by Reactive Sputter Deposition [R] . Aita, C. R. 1988

机译：反应溅射沉积法制备锌，铝和钒（及相关系统，金和锗氧化物，铝和钨氮化物）氧化物的低温薄膜生长

Relative SHG measurements of metal thin films: Gold, silver, aluminum, cobalt, chromium, germanium, nickel, antimony, titanium, titanium nitride, tungsten, zinc, silicon and indium tin oxide

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